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de Gyvez

de Gyvez

7 results found
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1.
Integrated Circuit Defect-Sensitivity: Theory and Computational Models37 %
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
By: Jose Pineda de Gyvez, José Pineda de Gyvez
Publisher: Springer
No Review Yet
₹9,600
₹6,048
Binding:
Paperback
Release:
23 Feb 2014
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Low-Power High-Resolution Analog to Digital Converters37 %
Low-Power High-Resolution Analog to Digital Converters
By: Amir Zjajo, Jose Pineda de Gyvez, José Pineda de Gyvez
Publisher: Springer
No Review Yet
₹4,800
₹3,024
Binding:
Hardback
Release:
05 Nov 2010
Language:
English
Available
Ships within 12-14 Days Explain..
3.
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
By: Gary Saul Morson, Jose Pineda de Gyvez, José Pineda de Gyvez
Publisher: Springer
No Review Yet
₹4,709
Binding:
Hardback
Release:
31 Dec 1992
Language:
English
Available
Ships within 4-6 Days Explain..
4.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits37 %
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev, Jose Pineda de Gyvez, José Pineda de Gyvez
Publisher: Springer
No Review Yet
₹19,200
₹12,096
Binding:
Paperback
Release:
10 Nov 2010
Language:
English
Available
Ships within 12-14 Days Explain..
5.
Low-Power High-Resolution Analog to Digital Converters37 %
Low-Power High-Resolution Analog to Digital Converters
By: Amir Zjajo, Jose Pineda de Gyvez, José Pineda de Gyvez
Publisher: Springer
No Review Yet
₹4,800
₹3,024
Binding:
Paperback
Release:
23 Aug 2016
Language:
English
Available
Ships within 12-14 Days Explain..
6.
Integrated Circuit Manufacturability54 %
Integrated Circuit Manufacturability
By: Dhiraj Pradham, Dhiraj Pradhan, Jose Pineda de Gyvez, José Pineda de Gyvez, de Gyvez
Publisher: Wiley-IEEE Press
No Review Yet
₹21,784
₹10,021
Binding:
Hardback
Release:
30 Oct 1998
Language:
English
Available
Ships within 4-6 Days Explain..
7.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits13 % POD/NR
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev, Jose Pineda de Gyvez, José Pineda de Gyvez
Publisher: Springer
No Review Yet
₹21,699
₹18,878
Binding:
Hardback
Release:
21 Jun 2007
Language:
English
International Edition
Ships within 14-16 Days Explain..
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Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
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