Humburger Icon
Logo1
Login & Sign up
Bookswagon-24x7 online bookstore
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
Bookswagon icon Categories
Close

Refine your Search

By Price

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
5 results found
List viewGrid view
Sort By:
1.
Testing and Validation of Computer Simulation Models38 % POD/NR
Testing and Validation of Computer Simulation Models
By: David J. Murray-Smith, David J Murray-Smith
Publisher: Springer International Publishing AG
No Review Yet
₹9,600
₹5,952
Binding:
Paperback
Release:
23 Aug 2016
Language:
English
International Edition
Ships within 14-16 Days Explain..
Free Shipping in India and low cost Worldwide.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
2.
Modelling and Simulation of Integrated Systems in Engineering33 %
Modelling and Simulation of Integrated Systems in Engineering
By: David J. Murray-Smith, D J Murray-Smith, D J (University of Glasgow, UK) Murray-Smith
Publisher: Woodhead Publishing
No Review Yet
₹27,930
₹18,713
Binding:
Hardback
Release:
30 May 2012
Language:
English
Available
Ships within 2-4 Days Explain..
3.
Testing and Validation of Computer Simulation Models37 %
Testing and Validation of Computer Simulation Models
By: David J. Murray-Smith, David J Murray-Smith
Publisher: Springer
No Review Yet
₹9,600
₹6,048
Binding:
Hardback
Release:
22 Oct 2015
Language:
English
Available
Ships within 12-14 Days Explain..
4.
Ruined Sinners to Reclaim24 % NR
Ruined Sinners to Reclaim
By: Mark Jones, Daniel Strange, David Gibson, Garry J Williams, Murray Smith
Publisher: Crossway Books
No Review Yet
₹5,207
₹3,957
Binding:
Hardback
Release:
30 Apr 2024
Language:
English
International Edition
Ships within 10-12 Days Explain..
Free Shipping in India and low cost Worldwide.
5.
Characterization and Metrology for ULSI Technology 2000NR
Characterization and Metrology for ULSI Technology 2000
By: , Robert McDonald, W Murray Bullis, Patrick J Smith, David G Seiler
Publisher: American Institute of Physics
No Review Yet
₹16,609
Binding:
SF
Release:
01 Mar 2001
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
No more records found