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David G. (National Institute of Standards and Technology, Hillsboro, OR, USA) Seiler

David G. (National Institute of Standards and Technology, Hillsboro, OR, USA) Seiler

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Metrology and Diagnostic Techniques for Nanoelectronics33 % NR
Metrology and Diagnostic Techniques for Nanoelectronics
By: David G. Seiler, Zhiyong Ma, David G Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR, USA) Seiler, Zhiyong (Intel Corporation, Hillsboro, OR, USA) Ma
Publisher: Pan Stanford Publishing
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₹37,554
₹25,161
Binding:
Hardback
Release:
03 Oct 2016
Language:
English
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