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David E Root

David E RootDavid E. Root is an Agilent Research Fellow at Agilent Technologies. He co-led the Agilent research and technical development of X-parameters through its commercialization. He is a Fellow of the IEEE and co-editor of Nonlinear Transistor Model Parameer Extraction Techniques (2011). Read More Read Less

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1.
Nonlinear Circuit Simulation and Modeling38 %
Nonlinear Circuit Simulation and Modeling
By: David E. Root, Jianjun Xu, Jose Carlos Pedro, David E Root, Jose Carlos (Universidade de Aveiro, Portugal) Pedro
Publisher: Cambridge University Press
No Review Yet
₹9,882
₹6,127
Binding:
Hardback
Release:
14 Jun 2018
Language:
English
Available
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2.
Natural History of Religion58 %
Natural History of Religion
By: H. E. Root, David Hume, H E Root, David Hume
Publisher: Stanford University Press
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₹1,575
₹662
Binding:
Paperback
Release:
01 Jun 1957
Language:
English
Available
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3.
Nonlinear Transistor Model Parameter Extraction Techniques43 %
Nonlinear Transistor Model Parameter Extraction Techniques
By: Christian Fager, Matthias Rudolph, David E. Root, David E Root, Christian (Chalmers University of Technology, Gothenberg) Fager
Publisher: Cambridge University Press
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₹13,252
₹7,554
Binding:
Hardback
Release:
13 Oct 2011
Language:
English
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4.
X-Parameters19 % POD/NR
X-Parameters
By: David E. Root, Jan Verspecht, Jason Horn, Mihai Marcu, David E Root
Publisher: Cambridge University Press
No Review Yet
₹11,135
₹9,019
Binding:
Hardback
Release:
26 Sep 2013
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
5.
X-Parameters32 % NR
X-Parameters
By: Jan Verspecht, Jason Horn, Mihai Marcu, David E Root
Publisher: Cambridge University Press
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₹15,480
₹10,458
Binding:
Digital (delivered electronically)
Release:
05 Oct 2013
Language:
English
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6.
Nonlinear Transistor Model Parameter Extraction Techniques32 % NR
Nonlinear Transistor Model Parameter Extraction Techniques
By: Christian Fager, Matthias Rudolph, David E Root
Publisher: Cambridge University Press
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₹15,480
₹10,458
Binding:
Digital (delivered electronically)
Release:
25 Oct 2011
Language:
English
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