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David Cherns

David Cherns

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1.
Evaluation of Advanced Semiconductor Materials by Electron Microscopy21 %
Evaluation of Advanced Semiconductor Materials by Electron Microscopy
By: David Cherns
Publisher: Springer
No Review Yet
₹4,800
₹3,792
Binding:
Paperback
Release:
13 Oct 2011
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Sampler of Riemann-Finsler Geometry54 %
Sampler of Riemann-Finsler Geometry
By: David Dai-Wai Bao, David Bao, Shiing-Shen Chern, Robert L. Bryant, Robert L Bryant
Publisher: Cambridge University Press
No Review Yet
₹12,628
₹5,809
Binding:
Hardback
Release:
01 Oct 2004
Language:
English
Available
Ships within 2-4 Days Explain..
3.
Sampler of Riemann-Finsler Geometry15 % POD/NR
Sampler of Riemann-Finsler Geometry
By: David Dai-Wai Bao, David Bao, Shiing-Shen Chern, Robert L. Bryant, Robert L Bryant
Publisher: Cambridge University Press
No Review Yet
₹5,519
₹4,691
Binding:
Paperback
Release:
09 Sep 2010
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
4.
Evaluation of Advanced Semiconductor Materials by Electron MicroscopyNR
Evaluation of Advanced Semiconductor Materials by Electron Microscopy
By: David Cherns
Publisher: Springer
No Review Yet
₹8,800
Binding:
Hardback
Release:
01 Jan 1990
Language:
English
Out of Stock
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5.
Finsler Geometry39 % NR
Finsler Geometry
By: David Dai-Wai Bao, David Bao, Shiing-Shen Chern, Zhongmin Shen, David Bao (University of Houston, TX, USA)
Publisher: American Mathematical Society
No Review Yet
₹12,198
₹7,441
Binding:
Paperback
Release:
15 Jul 1996
Out of Stock
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