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Daniel M. (Vanderbilt University, Nashville, Tennessee) Fleetwood

Daniel M. (Vanderbilt University, Nashville, Tennessee) Fleetwood

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Defects in Microelectronic Materials and Devices41 % NR
Defects in Microelectronic Materials and Devices
By: Ronald D. Schrimpf, Daniel M. Fleetwood, Daniel M Fleetwood, Ronald D Schrimpf, Daniel M. (Vanderbilt University, Nashville, Tennessee) Fleetwood
Publisher: CRC Press
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₹20,813
₹12,280
Binding:
Hardback
Release:
19 Nov 2008
Language:
English
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