Danelle M. Tanner

Danelle M. Tanner

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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IVNR
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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VNR
Publisher: Spie Press
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₹10,761
Binding:
Paperback
Release:
01 Jan 2006
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