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D. Keith Bowen

D. Keith Bowen

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1.
High Resolution X-Ray Diffractometry And Topography47 %
High Resolution X-Ray Diffractometry And Topography
By: Brian K Tanner, D.K. Bowen, Brian K. Tanner, D. Keith Bowen, D K Bowen
Publisher: CRC Press
No Review Yet
₹19,425
₹10,295
Binding:
Hardback
Release:
05 Feb 1998
Language:
English
Available
Ships within 12-14 Days Explain..
2.
X-Ray Metrology in Semiconductor Manufacturing42 %
X-Ray Metrology in Semiconductor Manufacturing
By: Brian K Tanner, D Keith Bowen, Brian K. (University of Durham, UK) Tanner, D. Keith (Bede Plc, Durham, UK) Bowen, D. Keith (Sarah Bowen, PhD, Addictive Behaviors Research Center, University of Washington, Seattle, WA) Bowen
Publisher: CRC Press
No Review Yet
₹20,250
₹11,745
Binding:
Hardback
Release:
24 Jan 2006
Language:
English
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