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D. Keith Bowen

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1.

$High Resolution X-Ray Diffractometry And Topography$ 41 %

High Resolution X-Ray Diffractometry And Topography

By: Brian K Tanner, D.K. Bowen, Brian K. Tanner, D. Keith Bowen, D K Bowen

Publisher: CRC Press

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₹19,425

₹11,461

Binding:	Hardback
Release:	05 Feb 1998
Language:	English

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2.

X-Ray Metrology in Semiconductor Manufacturing

34 %

X-Ray Metrology in Semiconductor Manufacturing

By: Brian K Tanner, D Keith Bowen, Brian K. (University of Durham, UK) Tanner, D. Keith (Bede Plc, Durham, UK) Bowen, D. Keith (Sarah Bowen, PhD, Addictive Behaviors Research Center, University of Washington, Seattle, WA) Bowen

Publisher: CRC Press

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₹20,400

₹13,464

Binding:	Hardback
Release:	24 Jan 2006
Language:	English

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