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D. Keith (Bede Plc, Durham, UK) Bowen

D. Keith (Bede Plc, Durham, UK) Bowen

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X-Ray Metrology in Semiconductor Manufacturing19 % NR
X-Ray Metrology in Semiconductor Manufacturing
By: Brian K Tanner, D Keith Bowen, Brian K. (University of Durham, UK) Tanner, D. Keith (Bede Plc, Durham, UK) Bowen, D. Keith (Sarah Bowen, PhD, Addictive Behaviors Research Center, University of Washington, Seattle, WA) Bowen
Publisher: CRC Press
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₹20,160
₹16,330
Binding:
Hardback
Release:
24 Jan 2006
Language:
English
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