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Conor S. Rafferty

Conor S. Rafferty

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Defects and Diffusion in Silicon Processing: Volume 469NR
Defects and Diffusion in Silicon Processing: Volume 469
By: Salvatore Coffa, Tomas Diaz De La Rubia, Conor S. Rafferty, Peter A. (Philips Research Laboratories, The Netherlands) Stolk, Tomas Diaz de la (Lawrence Livermore National Laboratory, California) Rubia
Publisher: Materials Research Society
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₹2,199
Binding:
Hardback
Release:
21 Nov 1997
Language:
English
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