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C.E. Fiori

C.E. Fiori

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Advanced Scanning Electron Microscopy and X-Ray Microanalysis21 %
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Joseph Goldstein, Patrick Echlin, David C. Joy, C.E. Fiori
Publisher: Springer
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₹9,600
₹7,584
Binding:
Paperback
Release:
08 Jun 2013
Language:
English
Available
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