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C. C. J. Vas

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43 %

Root Cause Analysis

By: Robert J Latino, Mark a Latino, Robert J. (Reliability Center, Inc., Hopewell, Virginia, USA) Latino, Kenneth C Latino, Kenneth C. (APM Product Manager, GE Digital, Roanoke, VA) Latino

Publisher: Taylor and Francis

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₹4,674

₹2,664

Binding:	Paperback
Release:	02 Apr 2021
Language:	English

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41 %

PROACT(R) Root Cause Analysis

By: Robert J Latino, Mark a Latino, Kenneth C Latino, Robert J. (CEO, Reliability Center, Inc., Hopewell, VA) Latino, Kenneth C. (APM Product Manager, GE Digital, Roanoke, VA) Latino

Publisher: Taylor and Francis

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₹6,104

₹3,601

Binding:	Hardback
Release:	11 Sep 2020
Language:	English

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8 % NR

Proact(r) Root Cause Analysis

By: Robert J Latino, Mark a Latino, Kenneth C Latino, Kenneth C. (APM Product Manager, GE Digital, Roanoke, VA) Latino, Mark A. (President, Reliability Center, Inc., Hopewell, VA) Latino

Publisher: CRC Press

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₹2,349

₹2,161

Binding:	Paperback
Release:	07 Oct 2024
Language:	English

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16 %

Clinical Eeg

By: C. C. J. Vas

Publisher: Ane Books Pvt. Ltd

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₹450

₹378

Release:	2013
Language:	English

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