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1.
VLSI Test Principles and Architectures17 % NR
VLSI Test Principles and Architectures
By: Charles Stroud, Benoit Nadeau-Dostie, Abhijit Chatterjee, Laung-Terng Wang, Nur Touba
Publisher: Morgan Kaufmann Publishers
No Review Yet
₹7,646
₹6,346
Binding:
Hardback
Release:
01 Jun 2006
Language:
English
International Edition
Ships within 18-20 Days Explain..
Free Shipping in India and low cost Worldwide.
2.
Design for At-Speed Test, Diagnosis and Measurement59 %
Design for At-Speed Test, Diagnosis and Measurement
By: Benoit Nadeau-Dostie, Øystein Linnebo
Publisher: Springer
No Review Yet
₹16,166
₹6,628
Binding:
Hardback
Release:
30 Sep 1999
Language:
English
Available
Ships within 1-2 Days Explain..
3.
Design for At-Speed Test, Diagnosis and Measurement37 %
Design for At-Speed Test, Diagnosis and Measurement
By: Benoit Nadeau-Dostie
Publisher: Springer
No Review Yet
₹14,400
₹9,072
Binding:
Paperback
Release:
26 Apr 2013
Language:
English
Available
Ships within 12-14 Days Explain..
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