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Aris Christou

Aris Christou

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1.
Electromigration and Electronic Device Degradation16 % POD/NR
Electromigration and Electronic Device Degradation
By: Aris Christou, Christou, A Christou, Aris (CALCE Electronic Packaging Research Center, University of Maryland) Christou
Publisher: Wiley-Interscience
No Review Yet
₹23,626
₹19,846
Binding:
Hardback
Release:
29 Dec 1993
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
2.
Integrating Reliability into Microelectronics Manufacturing (Design And Measurement in Electronic Engineering)12 %
Integrating Reliability into Microelectronics Manufacturing (Design And Measurement in Electronic Engineering)
By: Aris Christou
Publisher: Wiley-Blackwell
No Review Yet
₹12,081
₹10,631
Binding:
Hardcover
Release:
1994-04-25
Language:
English
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