Angela Duparre

Angela Duparre

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1.
Optical Inspection of MicrosystemsNR
Publisher: Taylor and Francis
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₹4,694
Binding:
Paperback
Release:
19 Oct 2019
Language:
English
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2.
Advanced Characterization Techniques for Optics, Semiconductors and Nanotechnologies (Proceedings of SPIE)NR
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3.
Optical Fabrication, Testing, and Metrology IIINR
Publisher: Spie Press
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₹10,862
Binding:
Paperback
Release:
16 Sep 2008
Language:
English
Out of Stock
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4.
Optical Fabrication, Testing, and Metrology IV2 % NR
Publisher: Spie Press
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₹9,318
₹9,132
Binding:
Paperback
Release:
15 Nov 2011
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5.
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies IINR
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6.
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies IIINR
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