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Anand Krishna Asundi (Editor)

Anand Krishna Asundi (Editor)

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1.
Advances in Metrology for X-Ray and EUV Optics VINR
Advances in Metrology for X-Ray and EUV Optics VI
By: Lahsen Assoufid, Lahsen Assoufid (Editor), Haruhiko Ohashi (Editor), Anand Krishna Asundi (Editor), Haruhiko Ohashi
Publisher: Spie Press
No Review Yet
₹6,127
Binding:
Paperback
Release:
28 Feb 2017
Out of Stock
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2.
Optical Micro- And NanometrologyNR
Optical Micro- And Nanometrology
By: Wolfgang Osten, Christophe Gorecki, Christophe Gorecki (Editor), Wolfgang Osten (Editor), Anand Krishna Asundi
Publisher: Spie Press
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₹10,173
Binding:
Paperback
Release:
30 Jun 2016
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